Abstract:
X-ray detectors made of CdTe crystals with a $p$–$n$ junction obtained by diffusion of In into $p$-CdTe are investigated. The basic characteristics of such a detector are studied for the first time. It is found that the device is highly sensitive to X rays at a low bias voltage (to -50 V) and the X-ray effective energy in the range 28–72 keV. It is shown that photovoltaic detectors based on CdTe with $p$–$n$ junctions are superior to Cd$_{0.9}$Zn$_{0.1}$Te ones.