This article is cited in 3 papers

Optics, Quantum Electronics

New focusing multilayer structures for X-ray and VUV plasma spectroscopy

A. Ya. Lopatin^a, V. I. Luchin^a, N. N. Salashchenko^a, N. I. Chkhalo^a, A. P. Shevel'ko^b, O. F. Yakushev<sup>b

a</sup> Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
^b P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow

Abstract: We investigate the spectral characteristics of new focusing multilayer structures used as dispersive elements in a high-transmission X-ray spectrometer with cylindrical geometry (Hamos scheme): W/B$_4$C structures in a wavelength range of $\lambda$ = 8.0–9.5 $\mathring{\mathrm{A}}$ and Cr/Sc structures in a range of $\lambda$ = 30–40 $\mathring{\mathrm{A}}$ (the range is not accessible for natural crystals). The results of demonstration experiments on laser-produced plasma spectra recording are considered. It is shown that the luminosity of a Hamos spectrometer with multilayer dispersive elements is an order of magnitude higher than the luminosity of grazing-incidence grating spectrographs with a comparable spectral resolution.

Received: 03.11.2009

 English version: Technical Physics, 2010, 55:7, 1018–1023

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