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Zhurnal Tekhnicheskoi Fiziki, 2010 Volume 80, Issue 6, Pages 135–137 (Mi jtf9487)

Brief Communications

Threshold power of induced thermal scattering in silica microcavities

M. V. Zhuravlev

Raymond and Beverly Sackler Faculty of Exact Sciences, School of Chemistry, Tel-Aviv University, 69978 Tel-Aviv, Ramat-Aviv, Israel

Abstract: The threshold power of Iaser-induced thermal scattering in a high-Q spherical silica microcavity is investigated theoretically as a function of diffraction parameter and the laser pump wavelength for twomode coupling. The threshold power is found to be comparable in order of magnitude with the threshold of Raman lasing and thermal instability in spherical silica microcavities and amounts to 100 $\mu$W for a resonator with a radius of 35 $\mu$m at a pump wavelength of 0.840 $\mu$m. This ensures the application of microcavities as high-sensitive tools for measuring temperature, thermal conductivity, and heat capacity and as stabilizers for microlasers.

Received: 23.09.2009


 English version:
Technical Physics, 2010, 55:6, 887–889

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