RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2010 Volume 80, Issue 6, Pages 121–124 (Mi jtf9483)

This article is cited in 3 papers

Brief Communications

On the growth of higher manganese silicide films on silicon

A. S. Orekhova, T. S. Kamilovb, A. G. Gaibovb, K. I. Vakhabovb, V. V. Klechkovskayaa

a Institute of Cristallography Russian Academy of Sciences, Moscow
b Tashkent State Technical University named after A. R. Beruni

Abstract: The growth of manganese silicide films on silicon under the conditions of equilibrium and non-equilibrium diffusion doping of the silicon from the vapor phase is studied for different weight percent of the dopant.

Received: 05.05.2009


 English version:
Technical Physics, 2010, 55:6, 874–876

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026