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// Zhurnal Tekhnicheskoi Fiziki
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Zhurnal Tekhnicheskoi Fiziki,
2010
Volume 80,
Issue 6,
Pages
121–124
(Mi jtf9483)
This article is cited in
3
papers
Brief Communications
On the growth of higher manganese silicide films on silicon
A. S. Orekhov
a
,
T. S. Kamilov
b
,
A. G. Gaibov
b
,
K. I. Vakhabov
b
,
V. V. Klechkovskaya
a
a
Institute of Cristallography Russian Academy of Sciences, Moscow
b
Tashkent State Technical University named after A. R. Beruni
Abstract:
The growth of manganese silicide films on silicon under the conditions of equilibrium and non-equilibrium diffusion doping of the silicon from the vapor phase is studied for different weight percent of the dopant.
Received:
05.05.2009
Fulltext:
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English version:
Technical Physics, 2010,
55
:6,
874–876
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Steklov Math. Inst. of RAS
, 2026