V. F. Dvoryankin, G. G. Dvoryankina, A. A. Kudryashov, A. G. Petrov, V. D. Golyshev, S. V. Bykova, “X-ray sensitivity of Cd$_{0.9}$Zn$_{0.1}$Te detectors”, Zhurnal Tekhnicheskoi Fiziki, 2010, Volume 80, Issue 2,Pages 149

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Brief Communications

X-ray sensitivity of Cd$_{0.9}$Zn$_{0.1}$Te detectors

V. F. Dvoryankin^a, G. G. Dvoryankina^a, A. A. Kudryashov^a, A. G. Petrov^a, V. D. Golyshev^b, S. V. Bykova^b

^a Kotelnikov Institute of Radioengineering and Electronics, Fryazino Branch, Russian Academy of Sciences
^b OOO Granit-A, Aleksandrov, Vladimir oblast, 601655, Russia

Abstract: The X-ray sensitivity of Cd$_{0.9}$Zn$_{0.1}$Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam makes with an electric field in the detector. In the energy range 28–72 keV, the sensitivity is the highest when the X-ray beam is normal to the electric field in the detector.

Received: 13.05.2009