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Zhurnal Tekhnicheskoi Fiziki, 2010 Volume 80, Issue 1, Pages 152–154 (Mi jtf9362)

This article is cited in 7 papers

Brief Communications

Crystallization and properties of CrSi$_2$ single crystals grown from a tin solution-melt

F. Yu. Solomkina, V. K. Zaitseva, N. F. Kartenkoa, A. S. Kolosovaa, A. S. Orekhovb, A. Yu. Samunina, G. N. Isachenkoa

a Ioffe Institute, St. Petersburg
b Institute of Cristallography Russian Academy of Sciences, Moscow

Abstract: Using the solution-melt method combined with the Bridgman method, CrS$_2$ single-crystal needles and single-crystal tubes are grown at a temperature lower than their melting (crystallization) temperature. Microcrystals thus grown feature an anomalously high thermal emf. The growth of CrSi$_2$ single-crystal tubes is an important step forward in the production of various devices based on high-temperature thermoelectric materials.

Received: 06.04.2009


 English version:
Technical Physics, 2010, 55:1, 151–153

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