This article is cited in 6 papers

Surfaces, Electron and Ion Emission

Adhesion of niobium films to differently oriented $\alpha$-Al$_2$O$_3$ surfaces

V. V. Mel'nikov^ab, S. V. Eremeev^ab, S. E. Kul'kova<sup>ab

a</sup> Institute of Strength Physics and Materials Science, Siberian Branch of the Russian Academy of Sciences, Tomsk
^b Tomsk State University

Abstract: The atomic and electronic structures of the Nb/$\alpha$-Al$_2$O$_3$ interface are studied by the electron density functional method. The structural and electronic properties of three corundum surfaces, as well as chemical bonds produced by metallic niobium films at variously oriented interfaces, are discussed. Relations between the electronic structure, geometry, and mechanical properties of the interfaces are analyzed. It is shown that the adhesion of niobium films to a great extent depends on the type of oxide surface.

Received: 04.03.2011

 English version: Technical Physics, 2011, 56:10, 1494–1500

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