Abstract:
The size of X-ray radiation coherent domains (250 $\pm$ 20 $\mathring{\mathrm{A}}$) is determined in a thin polycrystalline SmS film using X-ray diffraction patterns ($\theta-2\theta$ scanning, DRON-2 diffractometer, Cu$K_\alpha$ radiation) and the Selyakov–Scherrer formula with allowance for the effect of microstrains. An image of this film is taken with a transmission electron microscope, and regions with a characteristic size of 240 $\mathring{\mathrm{A}}$ are clearly visible in it. It is concluded that X-ray radiation coherent domains are visualized.
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