This article is cited in 1 paper

Brief Communications

Investigation of the hemoglobin adsorption in porous silicon by the ellipsometry method

V. V. Bolotov, N. A. Davletkildeev, A. A. Korotenko, E. Yu. Mosur, O. Yu. Proskurina, Yu. A. Sten'kin

Omsk Branch, Institute for Semiconductor Physics, Siberian Branch, RAS

Abstract: The hemoglobin adsorption in porous silicon is studied by the method of spectroscopic ellipsometry. The layer-by-layer component distribution in the porous silicon-hemoglobin system shows that hemoglobin molecules penetrate through the porous layer with a slight gradient of the protein volume fraction.

Received: 10.08.2010

 English version: Technical Physics, 2011, 56:7, 1053–1055

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