Abstract:
An approach to fabricating electroluminescence devices is suggested in which an active ZnSe layer in a nanocomposite form (nanocrystallite embedded in an amorphous matrix) is used for the first time. In contrast to standard thin-film electroluminescence devices, no impurity doping of the active layer is required for providing radiation with a given wavelength. The current-voltage characteristic of a developmental device is taken, and the impedance of an electroluminescence capacitor is measured. The electroluminescence spectrum is found to have a maximum at a wavelength of 335 nm.