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Zhurnal Tekhnicheskoi Fiziki, 2011 Volume 81, Issue 6, Pages 153–155 (Mi jtf9171)

This article is cited in 2 papers

Brief Communications

Radiation parameters of thin-film electroluminescent emitters based on ZnSe nanocomposite layers

R. G. Valeevab, A. N. Beltyukovab, V. M. Vetoshkinb, È. A. Romanovb, A. A. Eliseevc

a Physical-Technical Institute of the Ural Branch of the Russian Academy of Sciences, Izhevsk
b Udmurt State University, Izhevsk
c Lomonosov Moscow State University

Abstract: An approach to fabricating electroluminescence devices is suggested in which an active ZnSe layer in a nanocomposite form (nanocrystallite embedded in an amorphous matrix) is used for the first time. In contrast to standard thin-film electroluminescence devices, no impurity doping of the active layer is required for providing radiation with a given wavelength. The current-voltage characteristic of a developmental device is taken, and the impedance of an electroluminescence capacitor is measured. The electroluminescence spectrum is found to have a maximum at a wavelength of 335 nm.

Received: 15.09.2010


 English version:
Technical Physics, 2011, 56:6, 896–898

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