Abstract:
Time-of-flight mass spectroscopy methods are employed for studying processes occurring during capture of electrons by $^3$He$^{2+}$ and Ar$^{6+}$ multiply charged ions with energy 6$z$ keV ($z$ is the ion charge) from C$_2$H$_n$ molecules ($n$ = 2, 4, 6) with different multiplicities of C–C bonds. Fragmentation schemes of the molecular ions formed in such processes are established from analysis of correlations of recording times for all fragment ions. The absolute values of the cross sections of capture of an electron and capture with ionization are measured, as well as the cross sections of formation of fragment ions in these processes. The absolute values of total capture cross sections for several electrons are determined.