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Brief Communications

X-ray dosimetric characteristics of CdIn$_2$S$_4$ $\langle$Cu$\rangle$ single crystals

S. N. Mustafaeva^a, M. M. Asadov^b, J. T. Guseinov<sup>a

a</sup> Institute of Physics Azerbaijan Academy of Sciences
^b Institute of Chemical Problems, Baku

Abstract: The effect of doping CdIn$_2$S$_4$ single crystals by copper (3 mol%) on their X-ray dosimetric characteristics is investigated. It is found that the characteristic X-ray conductivity of CdIn$_2$S$_4$ $\langle$Cu$\rangle$ single crystals increases 3–16 times compared with undoped CdIn$_2$S$_4$ at effective radiation hardness $V_a$ = 25–50 keV and dose rate $E$ = 0.75–78.05 R/min. Moreover, the persistence of the crystal characteristics completely disappears and the supply voltage of a CdIn$_2$S$_4$ $\langle$Cu$\rangle$ X-ray detector decreases fivefold. The dependence of the steady X-ray-induced current in CdIn$_2$S$_4$ $\langle$Cu$\rangle$ on the X-ray dose is described as $\Delta I_{E,0}\propto E^{\alpha}$, where 0.6 $\le\alpha\le$ 1.8.

Received: 13.01.2010
Accepted: 18.05.2010

 English version: Technical Physics, 2011, 56:1, 139–142

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