V. B. Shirokov, Yu. I. Golovko, V. M. Mukhortov, “Optical properties of thin epitaxial Ba$_{0.8}$Sr$_{0.2}$TiO$_3$ films”, Zhurnal Tekhnicheskoi Fiziki, 2012, Volume 82, Issue 7,Pages 79

This article is cited in 5 papers

Optics, Quantum Electronics

Optical properties of thin epitaxial Ba$_{0.8}$Sr$_{0.2}$TiO$_3$ films

V. B. Shirokov^ab, Yu. I. Golovko^a, V. M. Mukhortov^a

^a Southern Research Center of the Russian Academy of Sciences, Rostov-on-Don
^b Southern Federal University, Rostov-on-Don

Abstract: The properties of nanodimensional (Ba$_{0.8}$Sr$_{0.2}$)TiO$_3$ films on single-crystal magnesia substrates are studied. The films are applied by rf sputtering and grow in the layer-by-layer mode. The lattice parameters are measured by the X-ray diffraction method. The transmission of the films with different thicknesses is studied in the wavelength range 190–1100 nm. When analyzing experimental optical parameters, additional relaxation parameters depicting a final lifetime of the oscillator are used to characterize the refractive index and absorption factor in the dispersion relation. Such an approach allows a more accurate approximation of experimental data.

Received: 27.06.2011