S. A. Lyaschenko, I. A. Tarasov, S. N. Varnakov, D. V. Shevtsov, V. A. Shvets, V. N. Zabluda, S. G. Ovchinnikov, N. N. Kosyrev, G. V. Bondarenko, S. V. Rykhlitskii, “In situ investigations of magneto-optical properties of thin Fe layers”, Zhurnal Tekhnicheskoi Fiziki, 2013, Volume 83, Issue 10,Pages <nobr>139

Brief Communications

In situ investigations of magneto-optical properties of thin Fe layers

S. A. Lyaschenko^ab, I. A. Tarasov^ab, S. N. Varnakov^ab, D. V. Shevtsov^ab, V. A. Shvets^cd, V. N. Zabluda^a, S. G. Ovchinnikov^ab, N. N. Kosyrev^ab, G. V. Bondarenko^a, S. V. Rykhlitskii^d

^a L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
^b M. F. Reshetnev Siberian State Aerospace University,
^c Novosibirsk State University
^d Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Abstract: A thin polycrystalline Fe film on a single-crystal Si substrate with natural SiO$_2$ oxide is obtained by thermal evaporation in ultrahigh vacuum. The magneto-optical properties of the resultant structure are investigated in situ by the methods of spectral ellipsometry. The values of the coercive force for the Fe film are obtained, and the magnetization reversal loop and the energy dependence of the equatorial Kerr effect are constructed. The effectiveness of magnetoellipsometry for in situ analysis of the geometrical and magnetooptical properties of thin ferromagnetic layers is demonstrated.

Received: 26.10.2012