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Zhurnal Tekhnicheskoi Fiziki, 2025 Volume 95, Issue 10, Pages 2038–2045 (Mi jtf8588)

Physical electronics

Multilayer rubidium-based mirrors for soft X-rays

M. A. Yamshchikovaab, V. G. Rogacheva, A. P. Shkurinovbc

a Federal State Unitary Enterprise "Russian Federal Nuclear Center — All-Russian Research Institute of Experimental Physics", Sarov, Nizhny Novgorod region
b Sarov branch of the Lomonosov Moscow State University
c Lomonosov Moscow State University, Faculty of Physics

Abstract: The paper presents a theoretical study of the construction of X-ray multilayer mirrors based on rubidium for the wavelength range of 11–17 nm. The problem of optimizing the multilayer configuration for such mirrors has been solved using a genetic algorithm. The possibility of achieving the reflectivity maximum theoretical limit of 78% for Ru/Rb mirrors at a wavelength of 13.5 nm and 83% for Al/Rb mirrors at a wavelength of 17 nm is substantiated.

Keywords: X-ray radiation, multilayer metal mirrors, refractive index, reflectivity, spectral selectivity, genetic algorithm.

Received: 25.07.2024
Revised: 15.05.2025
Accepted: 08.07.2025

DOI: 10.61011/JTF.2025.10.61357.244-24



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