XXIX Symposium "Nanophysics and Nanoelectronics" in Nizhny Novgorod, March 10-14, 2025
Experimental instruments and technique

Electron beam diagnostics using hard X-rays at the SRF SKIF

Yu. V. Khomyakov^ab, O. I. Meshkov^b, V. P. Naz'mov^bc, Ya. V. Rakshun^bd, V. A. Chernov^b, N. I. Chkhalo<sup>e

a</sup> SRF "SKIF"
^b G I. Budker Institute of Nuclear Physics, Siberian Branch of the Russian Academy of Sciences, Novosibirsk
^c Institute of Solid State Chemistry and Mechanochemistry, Siberian Branch of the Russian Academy of Sciences, Novosibirsk
^d Sobolev Institute of Geology and Mineralogy, Siberian Branch of the Russian Academy of Sciences, Novosibirsk
^e Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod

Abstract: This paper briefly describes some methods for measuring ultra-low emittance of an electron beam using hard X-rays. It is shown that a combination of diagnostic methods eliminates the influence of errors introduced by individual X-ray optical elements. Modeling of radiation beams has been performed in accordance with the proposed schemes for measuring emittance. For the most conservative scheme, a pinhole camera, achievable resolution is estimated to be 3.7 $\mu$m. An optical layout of a specialized diagnostic beamline for the SRF SKIF has been proposed.

Keywords: synchrotron radiation, hard X-rays, electron emittance, pinhole, speckle pattern, Billet lens, Young experiment, Young interferometer, Billet interferometer, pinhole camera, Kirkpatrick–Baez mirrors.

Received: 05.06.2025
Revised: 05.06.2025
Accepted: 05.06.2025

DOI: 10.61011/JTF.2025.10.61351.140-25

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