Abstract:
The paper presents measurements of passive, commercially available surface-mountable devices (SMD): capacitors and inductors in the sizes 0402 and 0201 at temperatures of 300 K, 77 K and 4 K. Frequency dependences of the nominal values and S-parameters were measured. The electrical capacitance values of SMD capacitors at temperatures of 77 K and 4 K were within 4% of the nominal value for NPO-type capacitors and capacitors fabricated using thin-film technology. The scattering matrices of the capacitors at 77 K and 4 K showed a small deviation from the values provided by the manufacturers. It was shown that SMD capacitors without thermally stabilized ceramics are not suitable for use in cryogenic applications. SMD inductors fabricated using thin-film technology at temperatures of 77 K revealed a variation in inductance of around 10%. This fact requires adjusting their scattering matrices presented by manufacturer at designing microwave cryogenic circuits with these inductors. The influence of the input and output lines on the inductance value and scattering matrix parameters when cooling to 4 K prevented us from determining the parameters of electronic components using this method. Further investigation is required to understand the behavior of surface-mount inductance at liquid Helium temperatures.
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