Physical science of materials

Experimental determination of residual strains and stresses in 2G HTS wire

A. V. Irodova, I. D. Karpov, O. A. Kondratev, V. S. Kruglov, V. E. Krylov, S. V. Shavkin, V. T. Em

National Research Centre "Kurchatov Institute", Moscow, Russia

Abstract: Using X-ray and neutron diffraction, residual strains and stresses were measured in the main components of the second generation high temperature superconducting (2G HTS) wire based on yttrium ceramics, which was produced at the National Research Center “Kurchatov Institute” – in the stainless steel carrier tape, YSZ and CeO$_2$ buffer layers, and the YBCO superconducting layer. Their changes during the wire manufacturing process were traced. The reliability of the results obtained is confirmed by their consistency. The method presented in the work for determining internal strain and stress is universal and is suitable for wires with different carrier tapes, buffer and superconducting layers.

Keywords: 2G HTS, residual strain/stress, AISI 310S tape, YSZ, CeO$_2$, YBCO, X-ray diffraction, neutron diffraction

Received: 18.05.2024
Revised: 22.11.2024
Accepted: 29.11.2024

DOI: 10.61011/JTF.2025.04.60009.185-24

Bibliographic databases:

•