This article is cited in 2 papers

XXVI International Symposium "Nanophysics and nanoelectronics", N.Novgorod, 14 - 17 March 2022
Photonics

Imaging system of a plasma torch of a Betatron X-ray source

E. S. Antushin^a, A. A. Akhsakhalyan^a, S. Yu. Zuev^a, A. Ya. Lopatin^a, I. V. Malyshev^a, A. N. Nechai^a, A. A. Perekalov^a, A. E. Pestov^a, N. N. Salashchenko^a, M. N. Toropov^a, B. A. Ulasevich^a, N. N. Tsybin^a, N. I. Chkhalo^a, A. A. Soloviev^b, M. V. Starodubtsev<sup>b

a</sup> Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
^b Federal Research Center A.V. Gaponov-Grekhov Institute of Applied Physics of the Russian Academy of Sciences, Nizhny Novgorod

Abstract: The paper describes the design of a microscope for studying a betatron radiation source based on the PEARL femtosecond laser complex in the SXR and EUV wavelength range. The main optical element of the microscope is a spherical Schwarzschild objective a x5 magnification. The device allows to study the size and spatial structure of the interaction area of laser radiation with matter, at a selected wavelength in the EUV or SXR range with a resolution of $\delta x$ = 2.75 $\mu$m. The operation wavelength ($\lambda$ = 13.5 nm) is set by multilayer X-ray mirrors. Thin-film absorption filters are used to suppress the background component of the signal.

Keywords: SXR and EUV radiation, betatron radiation, imaging x-ray optics, SXR microscope.

Received: 05.04.2022
Revised: 05.04.2022
Accepted: 05.04.2022

DOI: 10.21883/JTF.2022.08.52784.80-22

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