Physical electronics

Auger analysis of thallium oxide formed using a low-energy beam of oxygen ions

O. G. Ashkhotov, I. B. Ashkhotova

Kabardino-Balkar State University, Nalchik, Russia

Abstract: The effect of irradiation with low-energy oxygen ions on the composition and some properties of the layer formed on the thallium surface has been studied. It is shown that bombardment with oxygen ions leads to the formation of a two-dimensional oxide layer, which effectively passivates the surface.

Keywords: layer, spectroscopy, surface, energy, composition, bombardment.

Received: 20.10.2021
Revised: 02.03.2022
Accepted: 29.03.2022

DOI: 10.21883/JTF.2022.06.52520.279-21

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