This article is cited in 1 paper

Two-layer model of reflective ferromagnetic films in terms of magneto-optical ellipsometry studies

Olga A. Maksimova^ab, Sergey G. Ovchinnikov^ab, Nikolay N. Kosyrev^b, Sergey A. Lyaschenko<sup>cb

a</sup> Siberian Federal University, Svobodny, 79, Krasnoyarsk, 660041, Russia
^b Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Akademgorodok, 50/38, Krasnoyarsk, 660036, Russia
^c Reshetnev Siberian State Aerospace University, Krasnoyarsky Rabochy, 31, Krasnoyarsk, 660037, Russia

Abstract: An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model of ferromagnetic reflective films is in focus. The obtained algorithm can be used to control optical and magneto-optical properties during films growth inside vacuum chambers.

Keywords: magneto-optical ellipsometry, Kerr effect, two-layer model, ferromagnetic metal, reflection, growth control.

UDC: 517.9

Received: 17.11.2016
Received in revised form: 16.01.2017
Accepted: 02.02.2017

Language: English

DOI: 10.17516/1997-1397-2017-10-2-223-232

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