The Talbot effect under selective reflection from a Raman induced grating

Vasily G. Arkhipkin^ab, Sergey A. Myslivets<sup>ba

a</sup> Kirensky Institute of Physics Federal Research Center KSC SB RAS, Krasnoyarsk, Russian Federation
^b Siberian Federal University, Krasnoyarsk, Russian Federation

Abstract: In the present work, we study the Talbot effect under selective reflection of probe radiation at the interface between a dielectric and a layer of resonant atoms, in which a Raman grating is induced. Under such conditions, the interface can operate as a reflective diffraction grating. The cases of one- and two-dimensional gratings are considered. It is shown that the reflection coefficient, with the account of the selectively reflected wave, can be both greater or smaller than the usual Fresnel reflection coefficient. The Talbot effect can be observed for a selectively reflected wave in the near-field diffraction region. The spatial structure of the diffraction patterns essentially depends on the pump field intensity and the Raman detuning.

Keywords: Raman gain, Fresnel diffraction, Talbot effect, selective reflection.

UDC: 535.42

Received: 10.05.2022
Received in revised form: 18.07.2022
Accepted: 20.09.2022

Language: English

DOI: 10.17516/1997-1397-2022-15-6-687-698

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