This article is cited in 5 papers

OPTICS AND NUCLEAR PHYSICS

Effect of the mismatch of layer thicknesses on the focusing of X rays by multilayer Laue lens

V. I. Punegov

Institute of Physics and Mathematics, Komi Research Center, Ural Branch, Russian Academy of Sciences, Syktyvkar, 167982 Russia

Abstract: A numerical simulation has been performed to study the effect of the mismatch of layer thicknesses of multilayer Laue lenses (MLLs) on X-ray focusing. The spatial distributions of X-ray intensities in the bulk of a lens have been calculated with different gradients of the variation of the period of a MLL. It has been shown that the focal length, as well as the focal spot size, decreases with an increase in the mismatch of layer thicknesses of the MLL. The calculated focal spot size are significantly different from the values reported in other works. A physical nature of the focusing by the MLL has been revealed. It is determined by the Bragg diffraction and is not related to the configuration of the Fresnel zone plate.

Received: 05.03.2020
Revised: 05.03.2020
Accepted: 11.03.2020

DOI: 10.31857/S0370274X20070048

 English version: Journal of Experimental and Theoretical Physics Letters, 2020, 111:7, 376–382

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