This article is cited in 6 papers

CONDENSED MATTER

Experimental and theoretical in situ spectral magneto-ellipsometry study of layered ferromagnetic structures

O. A. Maximova^ab, S. A. Lyaschenko^a, M. A. Vysotin^ab, I. A. Tarasov^a, I. A. Yakovlev^a, D. V. Shevtsov^a, A. S. Fedorov^ab, S. N. Varnakov^a, S. G. Ovchinnikov<sup>ab

a</sup> Kirensky Institute of Physics, Federal Research Center KSC, Siberian Branch, Russian Academy of Sciences, Akademgorodok, Krasnoyarsk, Russia
^b Siberian Federal University, Krasnoyarsk, Russia

Abstract: A method for processing of in situ spectral magneto-ellipsometry data has been developed to analyze planar ferromagnetic nanostructures. A multilayer model containing a ferromagnetic layer with two interfaces, a nonferromagnetic buffer layer, and a nonferromagnetic substrate has been tested within a new approach to the interpretation of magnetic-field-modulated spectral ellipsometric measurements involving the magnetooptical Kerr effect in the transverse configuration. In particular, the effect of the thickness of the ferromagnetic layer on the results of magneto-ellipsometric measurements has been analyzed. The measurements have been performed with polycrystalline Fe films with different thicknesses on a nonferromagnetic SiO$_2$/Si(100) surface. The diagonal and off-diagonal components of the complex dielectric tensor in the spectral range of 1.38–3.45 eV have been determined by processing spectral magneto-ellipsometric data. The results have been compared to the available data obtained by other authors and to the calculation of the dielectric tensor of Fe within the density functional theory.

Received: 27.02.2019
Revised: 14.06.2019
Accepted: 14.06.2019

DOI: 10.1134/S0370274X19150037

 English version: Journal of Experimental and Theoretical Physics Letters, 2019, 110:3, 166–172

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