N. N. Novikova, V. A. Yakovlev, I. V. Kucherenko, “Infrared reflection and attenuated total reflection spectra in the Bi$_2$Se$_3$ topological insulator”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2015, Volume 102, Issue 4,Pages 253

This article is cited in 2 papers

CONDENSED MATTER

Infrared reflection and attenuated total reflection spectra in the Bi$_2$Se$_3$ topological insulator

N. N. Novikova^a, V. A. Yakovlev^a, I. V. Kucherenko^b

^a Institute of Spectroscopy, Russian Academy of Sciences, Fizicheskaya ul. 5, Troitsk, Moscow, 142190, Russia
^b Lebedev Physical Institute, Russian Academy of Sciences, Leninskii pr. 53, Moscow, 119991, Russia

Abstract: Infrared reflection and attenuated total reflection spectra are measured in the (111)Si/Bi$_2$Se$_3$ topological insulator film. The characteristic parameters of plasmons and phonons in the near-surface layers close to the Si-film interface are obtained from the dispersion analysis of the reflection spectra. It is found that the charge carrier density near the interface far exceeds that in the bulk. The dispersion laws for surface polaritons and waveguide modes are determined.

Received: 07.07.2015

DOI: 10.7868/S0370274X15160079