ATOMS, SPECTRA, RADIATIONS

Kossel lines in extremely asymmetric diffraction schemes

A. M. Afanas'ev^a, M. V. Koval'chuk^b, M. A. Chuev<sup>a

a</sup> Insitute of Physics and Technology, Russian Academy of Sciences, Moscow
^b Institute of Cristallography Russian Academy of Sciences, Moscow

Abstract: It is demonstrated theoretically that the intensity distribution within the Kossel lines in an extremely asymmetric X-ray diffraction scheme has an anomalous shape of a sharp peak exceeding the background intensity by several hundred times. The possibility of experimental observation of this phenomenon is discussed.

PACS: 61.10.Dp

Received: 13.02.2001

 English version: Journal of Experimental and Theoretical Physics Letters, 2001, 73:6, 271–273

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