This article is cited in 4 papers

CONDENSED MATTER

Finite-size effect in shot noise in hopping conduction

E. S. Tikhonov^ab, V. S. Khrapai^ab, D. V. Shovkun^a, D. Schuh<sup>c

a</sup> Institute of Solid State Physics, Russian Academy of Sciences
^b Moscow Institute of Physics and Technology
^c Universität Regensburg

Abstract: We study a current shot noise in a macroscopic insulator based on a two-dimensional electron system in GaAs in a variable range hopping (VRH) regime. At low temperature and in a sufficiently depleted sample a shot noise close to a full Poissonian value is measured. This suggests an observation of a finite-size effect in shot noise in the VRH conduction and demonstrates a possibility of accurate quasiparticle charge measurements in the insulating regime.

Received: 18.06.2013

Language: English

DOI: 10.7868/S0370274X13140142

 English version: Journal of Experimental and Theoretical Physics Letters, 2013, 98:2, 121–126

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