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JOURNALS // Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki // Archive

Pis'ma v Zh. Èksper. Teoret. Fiz., 2002 Volume 76, Issue 6, Pages 415–419 (Mi jetpl2927)

This article is cited in 1 paper

CONDENSED MATTER

Mobility of electrons on a liquid-helium film with a rough substrate

V. B. Shikin

Institute of Solid State Physics, Russian Academy of Sciences

Abstract: The origin of the specific activation-type behavior of the mobility of electrons on liquid-helium films with different kinds of substrates is discussed. The characteristic feature of the activation energy $E_a$ observed in the experiment is its dependence on the effective film thickness $d$ in the form $E_a\propto d^{-2}$. A scenario of this effect is proposed with consideration for the roughness of the substrate underlying the liquid-helium film.

PACS: 67.70.+n, 72.60.+g, 73.50.-h

Received: 20.06.2002
Revised: 19.07.2002


 English version:
Journal of Experimental and Theoretical Physics Letters, 2002, 76:6, 355–359

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