M. A. Andreeva, E. E. Odintsova, “Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2011, Volume 93, Issue 2,Pages <nobr>78

This article is cited in 1 paper

CONDENSED MATTER

Effect of small magnetic corrections to susceptibility on the angular dependences of the reflectivity of polarized X-rays from multilayer structures

M. A. Andreeva, E. E. Odintsova

M. V. Lomonosov Moscow State University, Faculty of Physics

Abstract: The X-ray resonant magnetic scattering (XRMS) method allows for the determination of optical constants including magnetic corrections, which are significant near the atomic X-ray absorption edges, by the shift of the Bragg angle of the reflection from periodic multilayers. Recently, Valvidares et al. [Phys. Rev. B 78, 064406 (2008)] revealed significant differences in the shape of “magnetic” Bragg reflection peaks from a $\mathrm{[Co_{73}Si_{27}(50\,\mathring A)/Si(30\,\mathring A)]_{10}}$ film for two opposite states of antiferromagnetic interlayer ordering. Valvidares et al. assumed that these features can be explained by the presence of the reflection-induced magnetic resonance correction. We have demonstrated that such corrections in the case of antiferromagnetic structures do not lead to a shift of the Bragg peak, but the shape of magnetic peaks is explained by the interference of the magnetic and nonmagnetic reflection amplitudes.

Received: 03.11.2010
Revised: 29.11.2010