INFORMATICS

A compact testing method for digital devices that provides maximum control reliability

Yu. K. Tlostanov

Institute of Computer Science and Problems of Regional Management KBSC RAS, Nal'chik

Abstract: An algorithm has been proposed for compressing the output binary sequences of the digital device under test, which eliminates the risk of missing errors. The characteristics of the output binary sequences of a reference digital device necessary for this are determined and techniques are proposed to ensure their achievement.

Keywords: compact testing method, digital devices

UDC: 681.326.7.74