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JOURNALS // Izvestiya Vysshikh Uchebnykh Zavedenii. Matematika // Archive

Izv. Vyssh. Uchebn. Zaved. Mat., 2020 Number 7, Pages 10–17 (Mi ivm9590)

This article is cited in 2 papers

About the reliability of circuits under failures of type $0$ at the outputs of elements in a complete finite basis containing some pairs of functions

M. A. Alekhina, T. A. Shornikova

Penza State Technological University, 1a/1 proezd Baidukova/str. Garagina, Penza, 440039 Russia

Abstract: We consider the realization of Boolean functions by the circuits from unreliable elements in a complete finite basis containing some pairs of functions. We assume that all elements of a circuit are exposed to the faults type $0$ at the outputs with probability $\varepsilon \in (0,1/2)$ independently of each other. We prove that almost any Boolean function can be implemented by an asymptotically optimal in reliability circuit functioning with the unreliability which is asymptotically equal to $\varepsilon$ with $\varepsilon \to 0$.

Keywords: unreliable functional gates, reliability and unreliability of circuit, synthesis of circuits composed of unreliable gates.

UDC: 519.718

Received: 15.04.2019
Revised: 14.01.2020
Accepted: 25.03.2020

DOI: 10.26907/0021-3446-2020-7-10-17


 English version:
Russian Mathematics (Izvestiya VUZ. Matematika), 2020, 64:7, 7–12

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© Steklov Math. Inst. of RAS, 2026