Physics

Application of atomic force microscopy for detection of influence of antibiotic upon the microbial cell (on the model of E.coli and I generation cephalosporins)

P. S. Erokhin, D. V. Utkin, O. S. Kuznetsov, N. P. Konnov, N. A. Ossina

Russian Research Anti-Plague Institute “Microbe”

Abstract: Alteration of E.coli cell wall caused by Cefazolin-AKOS was observed atomic force microscopy (AFM). Using semi-contact and contact modes the damaging effect of the Cefazolin-AKOS antibiotic was shown after a 30 minutes exposure. The assessment of physical parameters of cell allow to get more detailed information on the effect of antibiotics on microorganisms.

Keywords: AFM, semi-contact mode, contact mode, microorganisms, antibacterial agents, roughness, adhesion force, distribution lateral characteristics, sensitivity.

UDC: 579.23:53.086:615.281