This article is cited in 1 paper

Single fault detection test sets with respect to stuck-at faults at the outputs of gates in formulas over one basis of Zhegalkin type

Zhenyu Cui^a, D. S. Romanov

^a Lomonosov Moscow State University

Abstract: The article establishes the exact values of the Shannon function of the cardinality of a single fault detection test set with respect to stuck-at faults at outputs of gates in formulas over the basis $\{x\mathbin{\&}y,\,x\oplus y,\,x\sim y\}$.

Keywords: single fault detection test set, stuck-at faults, Boolean formula.

UDC: 519.718.7

MSC: 68M15

Received: 23.10.2024
Revised: 30.01.2025

DOI: 10.4213/im9667

 English version: Izvestiya: Mathematics, 2025, 89:6, 1281–1291

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