This article is cited in 3 papers

International Conference ''Mechanisms and Nonlinear Problems of Nucleation, Growth of Crystals and Thin Films'' dedicated to the memory of the outstanding theoretical physicist Professor V.V. Slezov (Proceedings) St. Petersburg, July 1-5, 2019
Surface physics and thin films

Layer crystallization in PZT/LNO/Si heterostructures

A. V. Atanova^a, O. M. Zhigalina^ab, D. N. Khmelenin^a, D. S. Seregin^c, K. A. Vorotilov<sup>c

a</sup> Shubnikov Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
^b Bauman Moscow State Technical University
^c MIREA — Russian Technological University, Moscow

Abstract: A Pb(Zr$_{0.52}$Ti$_{0.48}$)O$_{3}$–LaNiO$_{3}$–Si composition and LaNiO$_3$ thin films are synthesized using chemical solution deposition and studied by transmission electron microscopy. The polycrystalline, porous structure of LaNiO$_3$ is found to misalign the columnar structure of lead zirconate titanate. The effect that thermal treatment has on the structure and phase composition of lanthanum nickelate is addressed. The morphological features of LaNiO$_3$ film structure such as its layered character, porosity, and misalignment are observed in samples subjected to annealing at a temperature of 550$^\circ$C and are more pronounced upon raising the temperature to 800$^\circ$C.

Keywords: thin films, chemical solution deposition, transmission electron microscopy, lead zirconate titanate, lanthanum nickelate.

Received: 16.07.2019
Revised: 16.07.2019
Accepted: 25.07.2019

DOI: 10.21883/FTT.2019.12.48575.03ks

 English version: Physics of the Solid State, 2019, 61:12, 2464–2467

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