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JOURNALS // Fizika Tverdogo Tela // Archive
Fizika Tverdogo Tela, 1986 Volume 28, Issue 2, Pages 440–446 (Mi ftt84)
X-ray topography study of microdefects in silicon

N. O. Krylova, V. Meling, I. L. Shul'pina, È. G. Sheikhet

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

UDC: 537.312

Received: 16.07.1985



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