This article is cited in 25 papers

Reviews

X-ray diffraction topography methods (review)

V. V. Lider

FSRC "Crystallography and Photonics" RAS, Moscow, Russia

Abstract: The review describes various X-ray diffraction methods for visualizing defects in the crystal lattice, discusses the formation of diffraction contrast, and gives examples of the use of X-ray topography to study various structural defects of the crystal lattice.

Keywords: X-rays, diffraction, topography, diffraction contrast.

Received: 08.10.2020
Revised: 08.10.2020
Accepted: 20.10.2020

DOI: 10.21883/FTT.2021.02.50461.212

 English version: Physics of the Solid State, 2021, 63:2, 189–214

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