N. V. Shitov, A. A. Lomov, V. A. Bushuev, A. I. Baranov, P. A. Aleksandrov, “Triple crystal X-ray diffractometric study of the effect of low temperature annealing on the structural parameters of juvenile surfaces of $\mathrm{CsDSO}_{4}$ and $\mathrm{CsH}_{2}\mathrm{PO}_{4}$ single crystals”, Fizika Tverdogo Tela, 1991, Volume 33, Issue 12,Pages 3529

Triple crystal X-ray diffractometric study of the effect of low temperature annealing on the structural parameters of juvenile surfaces of $\mathrm{CsDSO}_{4}$ and $\mathrm{CsH}_{2}\mathrm{PO}_{4}$ single crystals

N. V. Shitov, A. A. Lomov, V. A. Bushuev, A. I. Baranov, P. A. Aleksandrov

M. V. Lomonosov Moscow Institute of Fine Chemical Technology

UDC: 548.732

Received: 01.07.1991