R. I. Dzhioev, K. V. Kavokin, “Optical measurement of the electron diffusion length and surface recombination rate in $p$-$\mathrm{GaAs}$ layers”, Fizika Tverdogo Tela, 1991, Volume 33, Issue 10,Pages 2928

Optical measurement of the electron diffusion length and surface recombination rate in $p$-$\mathrm{GaAs}$ layers

R. I. Dzhioev, K. V. Kavokin

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

UDC: 621.315

Received: 30.04.1991