Experimental and theoretical study of Bragg reflection of X-rays from elastically bent silicon crystals

K. T. Gabrielyan, E. N. Kislovskii, I. V. Prokopenko, F. N. Chukhovskii

Institute of Semiconductors of the Academy of Sciences of the Ukrainian SSR

UDC: 539.24:27.54 8.73

Received: 03.03.1986

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