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Fizika Tverdogo Tela, 2011 Volume 53, Issue 8, Pages 1542–1547 (Mi ftt13419)

This article is cited in 12 papers

Impurity centers

Luminescence and scintillation properties of Y$_3$Al$_5$O$_{12}$ : Ce single crystals and single-crystal films

Yu. V. Zorenkoab, V. P. Savchina, V. I. Gorbenkoa, T. I. Voznyaka, T. E. Zorenkoa, V. M. Puzikovc, A. Ya. Dan’koc, S. V. Nizhankovskiic

a Ivan Franko National University of L'viv
b Institute of Physics, Kazimierz Wielki University in Bydgoszcz, Bydgoszcz, Poland
c Institute for Single Crystals, National Academy of Sciences of Ukraine, Kharkov

Abstract: Luminescence and scintillation properties of Y$_3$Al$_5$O$_{12}$ : Ce single crystals grown from the melt by the Czochralski and horizontal directed crystallization methods in various gas media and Y$_3$Al$_5$O$_{12}$ : Ce single-crystal films grown by liquid-phase epitaxy from a melt solution based on a PbO–B$_2$O$_3$ flux have been comparatively analyzed. The strong dependence of scintillation properties of Y$_3$Al$_5$O$_{12}$ : Ce single crystals on their growth conditions and concentrations of YAl antisite defects and vacancy defects has been established. Vacancy defects are involved in Ce$^{3+}$ ion emission excitation as the centers of intrinsic UV luminescence and trapping centers. It has been shown that Y$_3$Al$_5$O$_{12}$ : Ce single-crystal films are characterized by faster scintillation decay kinetics than single crystals and a lower content of slow components in Ce$^{3+}$ ion luminescence decay during high-energy excitation due to the absence of YAl antisite defects in them and low concentration of vacancy defects. At the same time, the light yield of Y$_3$Al$_5$O$_{12}$ : Ce single-crystal films is comparable to that of single crystals grown by directed crystallization due to the quenching effect of the Pb$^{2+}$ ion impurity as a flux component and is slightly lower ($\sim$25%) than the light yield of single crystals grown by the Czochralski method.

Received: 12.10.2010
Accepted: 10.02.2011


 English version:
Physics of the Solid State, 2011, 53:8, 1620–1625

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