This article is cited in 1 paper

Magnetism

Parameters of the transition layer in the exchange-biased NiFe/DyCo film structure

G. I. Frolov^ab, V. A. Seredkin^ab, V. Yu. Yakovchuk<sup>ac

a</sup> L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
^b M. F. Reshetnev Siberian State Aerospace University,
^c Siberian Federal University, Krasnoyarsk

Abstract: The parameters of the transition layer in exchange-biased film structures are necessary agents to understand the mechanism of formation of unidirectional anisotropy. The layer thickness in NiFe/DyCo films has been determined by comparison of signals of the polar magneto-optical Kerr effect from a reference DyCo film and a hard magnetic layer of the exchange-biased structure. The layer thickness obtained is one order of magnitude larger than that characteristic of ferromagnet-antiferromagnet bilayer films. The mechanism of magnetization reversal of the structure under study has been explained within the model suggesting the formation of 180$^\circ$ boundaries in the interface.

Received: 20.12.2010

 English version: Physics of the Solid State, 2011, 53:7, 1348–1352

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