Abstract:
The specific features of the magnetic textures of the multilayer thin film systems [CoFe/TiZr]$_{68}$ and [CoFe/TiZr]$_{195}$ have been studied using polarized neutron reflectometry with an external magnetic field applied in different ways. A technique has been developed for taking into account systematic errors of the measurement setup, which has made it possible to reveal additional components in specular neutron “spinflip” reflections, whose origin is not related to the well-known mechanism of Zeeman splitting. The samples under investigation are characterized by large differences in hysteresis curves, remanent magnetizations, and magnetic textures. The experimental data have been analyzed using the results obtained by the author in the previous works.
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