This article is cited in 2 papers

Surface physics, thin films

On the adhesion theory of solids in terms of the dielectric formalism

V. K. Nevolin, F. R. Fazylov

Moscow State Institute of Electronic Technology (Technical University)

Abstract: The calculated dependences for computing the energy and strength of the ideal adhesion for solids (metals, semiconductors, and dielectrics) have been obtained in terms of the dielectric formalism. The inclusion of the linear and quadratic dispersions of surface plasmons provides a good agreement of the calculated values with the available data.

Received: 26.02.2010
Accepted: 22.07.2010

 English version: Physics of the Solid State, 2011, 53:3, 634–637

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