This article is cited in 3 papers

Semiconductors

Far-infrared reflection spectra of SmS polycrystals

Yu. V. Ulashkevich, V. V. Kaminskii, M. M. Kazanin

Ioffe Institute, St. Petersburg

Abstract: The reflection spectra of polycrystalline SmS samples have been measured in the far-infrared region within a broad temperature interval (293–80 K). Such measurements have been demonstrated to be efficient in the determination of the gradient in free electron concentration, an important aspect for the estimation of the magnitude of the thermovoltaic effect in a sample.

Received: 18.04.2012

 English version: Physics of the Solid State, 2012, 54:11, 2198–2200

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