This article is cited in 1 paper

Phase transitions

Destruction of SmS single crystals during the semiconductor-metal phase transition under hydrostatic compression

N. N. Stepanov, N. V. Sharenkova, V. V. Kaminskii, M. M. Kazanin

Ioffe Institute, St. Petersburg

Abstract: The behavior of internal microstresses, the size of the X-ray coherent scattering region, and the residual amount of the metal phase during the cyclic loading of SmS single crystals at hydrostatic pressure above the critical pressure of the semiconductor-metal phase transition has been investigated. It has been shown that the samples are destroyed as the microstresses reach the values corresponding to the ultimate stress of SmS single crystals. As the number of loading cycles increases, the coherent scattering region gradually decreases, which is accompanied by a decrease in the amount of the metal phase in the samples.

Received: 18.01.2012

 English version: Physics of the Solid State, 2012, 54:8, 1681–1683

Bibliographic databases:

•