This article is cited in 2 papers

Mechanical properties, strength physics and plasticity

X-ray and magnetic-field-enhanced change in physical characteristics of silicon crystals

V. A. Makara, L. P. Steblenko, A. N. Krit, D. V. Kalinichenko, A. N. Kurilyuk, S. N. Naumenko

National Taras Shevchenko University of Kyiv

Abstract: The effect of low-energy ($W$ = 8 keV) low-dose ((0.3–7.3) $\times$ 10$^2$ Gy) radiation and a dc magnetic field ($B$ = 0.17 T) on structural, micromechanical, and microplastic characteristics of silicon crystals has been studied. The features in the dynamic behavior of dislocations in silicon crystals, which manifest themselves upon only X-ray exposure and combined (X-ray and magnetic) exposure, have been revealed.

Received: 02.11.2011
Accepted: 10.01.2012

 English version: Physics of the Solid State, 2012, 54:7, 1440–1444

Bibliographic databases:

•