Optical properties

Shift and broadening of surface polaritons of sapphire upon deposition of a quasicrystalline film

N. N. Novikova^a, E. D. Ol'shanskii^b, A. A. Teplov^b, D. S. Shaitura^b, V. A. Yakovlev<sup>a

a</sup> Institute of Spectroscopy, Russian Academy of Sciences, Troitsk, Moscow
^b National Research Centre "Kurchatov Institute", Moscow

Abstract: The influence of a quasicrystalline Al–Pd–Re film on the shift and broadening of surface polaritons of a substrate (sapphire) has been studied. Measurements have been performed both on a sample containing only the quasicrystalline phase and on a sample which, in addition to the quasicrystalline phase, contains the crystalline (metallic) phase. The complex dielectric function of the films in the mid-IR region (650–800 cm$^{-1}$) has been estimated.

Received: 21.07.2011

 English version: Physics of the Solid State, 2012, 54:3, 573–577

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