This article is cited in 2 papers

Low dimensional systems

Impedance spectra of thin permalloy films with a nanoisland structure

B. A. Belyaev^ab, N. A. Drokin<sup>a

a</sup> L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
^b M. F. Reshetnev Siberian State University of Science and Technologies, Krasnoyarsk

Abstract: The behavior of the impedance spectra of island permalloy films prepared through vacuum evaporation onto optically polished glass-ceramic substrates has been investigated in the frequency range from 0.0001 to 100 MHz. A resistor-capacitor model of the films has been developed and the model parameters, for which there is a good agreement with experimental data on the frequency dependences of the real and imaginary components of the impedance, have been determined. The specific features in the behavior of the electrical and physical characteristics with variations in the thickness of the sample and the gap between the measuring electrodes have been investigated. It has been found that the relative permittivity of the films under investigation reaches values $\varepsilon\sim$ 10$^7$–10$^8$. The structural relaxation times have been calculated.

Received: 15.06.2011

 English version: Physics of the Solid State, 2012, 54:2, 360–367

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