Abstract:
Modern flash memory operates through the confinement (trapping) of electrons at defect sites within a dielectric layer, which modulates the resistance of a two-dimensional semiconductor channel. In this work, we numerically investigate structural ordering-specifically, Wigner crystallization-of localized electrons in deep trapping sites. The angular distribution function of these electrons confirms their Wigner localization.
Keywords:Wigner cluster, flash memory, localized electrons, angular distribution function.