È. P. Domashevskaya, A. V. Chernyshev, S. Yu. Turishchev, Yu. E. Kalinin, A. V. Sitnikov, D. E. Marchenko, “X-Ray photoelectron spectroscopy investigations of atomic interactions in surface layers of multilayered nanostructures (Co$_{45}$Fe$_{45}$Zr$_{10}$/$a$-Si)$_{40}$ and (Co$_{45}$Fe$_{45}$Zr$_{10}$/SiO$_2$)$_{32}$”, Fizika Tverdogo Tela, 2014, Volume 56, Issue 11,Pages 2219

This article is cited in 11 papers

Surface physics, thin films

X-Ray photoelectron spectroscopy investigations of atomic interactions in surface layers of multilayered nanostructures (Co$_{45}$Fe$_{45}$Zr$_{10}$/$a$-Si)$_{40}$ and (Co$_{45}$Fe$_{45}$Zr$_{10}$/SiO$_2$)$_{32}$

È. P. Domashevskaya^a, A. V. Chernyshev^a, S. Yu. Turishchev^a, Yu. E. Kalinin^b, A. V. Sitnikov^b, D. E. Marchenko^c

^a Voronezh State University
^b Voronezh State Technical University
^c Physikalische und Theoretische Chemie, Freie Universität Berlin, Berlin, Germany

Abstract: The interatomic interaction and chemical state of elements in amorphous multilayered (Co$_{45}$Fe$_{45}$Zr$_{10}$/$a$-Si)$_{40}$ and (Co$_{45}$Fe$_{45}$Zr$_{10}$/SiO$_2$)$_{32}$ nanostructures with different interlayers have been investigated by X-ray photoelectron spectroscopy using synchrotron radiation. The results of X-ray photoelectron spectroscopy investigations have demonstrated that, in surface layers of all the studied multilayered structures, the metallic layer components Co, Fe, and Zr are in the oxidized state. The silicon state is found to be identical and close to the state of nonstoichiometric silicon oxide, regardless of the presumed compositions of SiO$_2$ and $a$-Si interlayers. After the removal of surface layers of the multilayered structures in the sample preparation chamber by ion etching, the metallic layer components Co, Fe, and Zr are predominantly in the elemental state.

Received: 10.12.2013
Accepted: 09.06.2014